Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Kindle Edition or EPUB + Converted PDF نویسندگان: Joseph Goldstein, Dale E. Newbury, David C. Joy
جزئیات
فرمت: Kindle Edition or EPUB + Converted PDF ناشر: Springer; 3rd edition (December 6, 2012) تاریخ انتشار نسخه الکترونیکی : December 6, 2012
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شابک: 9781461349693 لینک: https://www.amazon.com/dp/B000VQEY5K
249,000 تومان
زمان تحویل: حداکثر 24 ساعت
توضیحات
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
249,000 تومان
زمان تحویل: حداکثر 24 ساعت