High Resolution X-Ray Diffractometry And Topography
Original PDF نویسندگان: D.K. Bowen, Brian K. Tanner
جزئیات
فرمت: Original PDF صفحات: 264 pages ناشر: CRC Press تاریخ انتشار نسخه الکترونیکی : February 5, 1998
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شابک: 9780203979198 لینک: https://www.amazon.com/dp/B00SC807H8
1,449,000 تومان
زمان تحویل: حداکثر 24 ساعت
توضیحات
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization
1,449,000 تومان
زمان تحویل: حداکثر 24 ساعت